Table of Contents
Monte Carlo Workshop – Theory and Applications
The Monte Carlo method is a well-established tool for simulating parameters of interest to the X-ray microanalyst such as electron and X-ray interaction volumes and production of X-rays from multilayer samples and across interfaces. This half-day workshop will include a presentation giving an overview of the Monte Carlo method for simulating electron interactions, X-ray production and production of other signals. This will be followed by presentations and hands-on exercises on how to use various Monte Carlo software packages (CASINO, MCXray, DTSA II, SS_MC…).
Target audience: Beginner to expert
Workshop presenters
- Prof. Raynald Gauvin, McGill University, Montréal, Canada
- Dr Peter Miller, Monash University/CSIRO Mineral Resources, Clayton, Australia
- Dr Nicholas Ritchie, National Institute of Standards and Technology, Gaithersburg, MD, U.S.A.
Date and time
The workshop will be held on Tuesday the 10th of February, commencing at 1:30 PM.
Location
EL Archer Room, Level 1, Bld 121, Western Precinct, CSIRO Clayton Site, Research Way, Clayton. Go to CSIRO Western reception.
Workshop instructions
Attendees will need a laptop running Windows 11 to run Monte Carlo software.
Monte Carlo examples
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| Modelling the trajectories of 20keV electrons at 45° incidence in a multi-layered specimen. 1000 trajectories shown. | |
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| Calculated lateral and depth distributions of x-ray generation for Ca Kα (left) and S Kα (right) in a multi-layered specimen of calcite (CaCO3), galena (PbS), calcite (again), and quartz (SiO2). Distributions calculated for 100,000 trajectories. Click on images for larger view. | |